Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers

B. Lesiak, A. Kosinski, M. Krawczyk, L. Zommer, A. Jablonski, J. Zemek, P. Jiricek, L. Kövér, J. Tóth, D. Varga, I. Cserny

Research output: Contribution to journalArticle

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Abstract

The inelastic mean free path (IMFP) values for organic materials are very limited. Numerous data have been published mainly for elemental solids, binary alloys and semiconductors. Generally, the IMFP values for different energies can be determined from the theoretical models involving the optical data, from predictive formulas, and from the experimental method called the elastic peak electron spectroscopy (EPES). In the present work the IMFPs in N-(CH)x polyacetylene (unstretched), synthesised according to Naarmann and Theophilou, and this polyacetylene doped with Pd were determined. The IMFPs energy dependence for the above samples has been obtained from the EPES in the primary electron energy range of 200-5000 eV. The experimental data have been recorded using three different spectrometers and compared with the theoretical data available.

Original languageEnglish
Pages (from-to)168-172
Number of pages5
JournalApplied Surface Science
Volume144-145
Issue number0
Publication statusPublished - Apr 1999

Fingerprint

Polyacetylenes
Electron spectroscopy
polyacetylene
mean free path
electron spectroscopy
Spectrometers
spectrometers
Electrons
Binary alloys
binary alloys
organic materials
electrons
electron energy
methylidyne
Semiconductor materials
energy

Keywords

  • Elastic peak electron spectroscopy
  • IMFP
  • Polyacetylene

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

Cite this

Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers. / Lesiak, B.; Kosinski, A.; Krawczyk, M.; Zommer, L.; Jablonski, A.; Zemek, J.; Jiricek, P.; Kövér, L.; Tóth, J.; Varga, D.; Cserny, I.

In: Applied Surface Science, Vol. 144-145, No. 0, 04.1999, p. 168-172.

Research output: Contribution to journalArticle

Lesiak, B, Kosinski, A, Krawczyk, M, Zommer, L, Jablonski, A, Zemek, J, Jiricek, P, Kövér, L, Tóth, J, Varga, D & Cserny, I 1999, 'Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers', Applied Surface Science, vol. 144-145, no. 0, pp. 168-172.
Lesiak, B. ; Kosinski, A. ; Krawczyk, M. ; Zommer, L. ; Jablonski, A. ; Zemek, J. ; Jiricek, P. ; Kövér, L. ; Tóth, J. ; Varga, D. ; Cserny, I. / Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers. In: Applied Surface Science. 1999 ; Vol. 144-145, No. 0. pp. 168-172.
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