Determination of partial pair distribution functions in amorphous Ge15Te85 by simultaneous RMC simulation of diffraction and EXAFS data

I. Kaban, P. Jóvári, W. Hoyer, E. Welter

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Abstract

The atomic structure of amorphous Ge15Te85 has been studied by X-ray absorption spectroscopy (EXAFS) at Ge K-edge. EXAFS data were modeled simultaneously with existing X-ray and neutron diffraction measurements by the reverse Monte Carlo (RMC) simulation technique. Combination of the three independent measurements allowed separation of the partial pair correlation functions gGeTe(r) and gTeTe(r) and estimation of the corresponding coordination numbers.

Original languageEnglish
Pages (from-to)2474-2478
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume353
Issue number24-25
DOIs
Publication statusPublished - Jul 15 2007

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Keywords

  • Chalcogenides
  • Monte Carlo simulations
  • Neutron diffraction/scattering
  • Short-range order
  • X-ray diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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