Determination of grain-boundary diffusion of Ag in nanocrystalline Cu by the Hwang-Balluffi method

Z. Erdélyi, Ch Girardeaux, G. A. Langer, D. L. Beke, A. Rolland, J. Bernardini

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Abstract

From the Ag and Cu Auger signals measured on the surface of nanocrystalline Cu/Ag thin bilayers, the temperature dependence of the parameter ω for Ag grain-boundary diffusion in Cu (ω=δkbDbsks, where δ and δs are the width of the grain boundary and the segregated layer and kb and ks are the grain-boundary and surface segregation factors, respectively) have been determined by the Hwang-Balluffi method in the C-kinetics regime over the temperature range of 393-428 K. These values have been compared with triple products, P=δkbDb, determined in the temperature range 584-804 K by Bernardini et al. [Phil. Mag. A 73, 237 (1996)] using radio tracer technique in the B-kinetics regime and the temperature dependence of the surface segregation factor has been extracted. The surface segregation energy (34±16 kJ/mol) agrees well with other data published in the literature.

Original languageEnglish
Pages (from-to)3971-3975
Number of pages5
JournalJournal of Applied Physics
Volume89
Issue number7
DOIs
Publication statusPublished - Apr 1 2001

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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