Determination of fluorine by total reflection X-ray fluorescence spectrometry

G. Tarsoly, M. Óvári, G. Záray

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). In this study, the analytical performance of the total reflection X-ray fluorescence spectrometry for determination of fluorine was investigated applying a spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a silicon drift detector (SDD) with ultra thin window was used. The detection limit for fluorine was found to be 5 mg L- 1 (equivalent to 10 ng absolute) in aqueous matrix. The linear range of the fluorine determination is between 15 and 500 mg L- 1, within this range the precision is below 10%. The matrix effects of the other halogens (chlorine, bromine and iodine), and sulfate were also investigated. It has been established that the upper allowed concentration limit of the above interfering elements is 100, 200, 50 and 100 mg L- 1 for Cl, Br, I and sulfate, respectively. Moreover, the role of the pre-siliconization of the quartz carrier plate was investigated. It was found, that the presence of the silicone results in poorer analytical performance, which can be explained by the thicker sample residue and stronger self-absorption of the fluorescent radiation.

Original languageEnglish
Pages (from-to)287-290
Number of pages4
JournalSpectrochimica Acta - Part B Atomic Spectroscopy
Volume65
Issue number4
DOIs
Publication statusPublished - Apr 2010

Fingerprint

Fluorine
fluorine
Chemical elements
fluorescence
Sulfates
sulfates
Carbon
spectroscopy
X ray tubes
Bromine
Quartz
Halogens
x rays
Monochromators
self absorption
carbon
Chlorine
Trace Elements
silicones
Silicon

Keywords

  • Detection limit
  • Fluorine
  • Interference effects
  • Linearity range
  • TXRF

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Analytical Chemistry
  • Spectroscopy

Cite this

Determination of fluorine by total reflection X-ray fluorescence spectrometry. / Tarsoly, G.; Óvári, M.; Záray, G.

In: Spectrochimica Acta - Part B Atomic Spectroscopy, Vol. 65, No. 4, 04.2010, p. 287-290.

Research output: Contribution to journalArticle

@article{4b05e4e33f474995be2ba44a066213fa,
title = "Determination of fluorine by total reflection X-ray fluorescence spectrometry",
abstract = "There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). In this study, the analytical performance of the total reflection X-ray fluorescence spectrometry for determination of fluorine was investigated applying a spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a silicon drift detector (SDD) with ultra thin window was used. The detection limit for fluorine was found to be 5 mg L- 1 (equivalent to 10 ng absolute) in aqueous matrix. The linear range of the fluorine determination is between 15 and 500 mg L- 1, within this range the precision is below 10{\%}. The matrix effects of the other halogens (chlorine, bromine and iodine), and sulfate were also investigated. It has been established that the upper allowed concentration limit of the above interfering elements is 100, 200, 50 and 100 mg L- 1 for Cl, Br, I and sulfate, respectively. Moreover, the role of the pre-siliconization of the quartz carrier plate was investigated. It was found, that the presence of the silicone results in poorer analytical performance, which can be explained by the thicker sample residue and stronger self-absorption of the fluorescent radiation.",
keywords = "Detection limit, Fluorine, Interference effects, Linearity range, TXRF",
author = "G. Tarsoly and M. {\'O}v{\'a}ri and G. Z{\'a}ray",
year = "2010",
month = "4",
doi = "10.1016/j.sab.2010.02.019",
language = "English",
volume = "65",
pages = "287--290",
journal = "Spectrochimica Acta, Part B: Atomic Spectroscopy",
issn = "0584-8547",
publisher = "Elsevier",
number = "4",

}

TY - JOUR

T1 - Determination of fluorine by total reflection X-ray fluorescence spectrometry

AU - Tarsoly, G.

AU - Óvári, M.

AU - Záray, G.

PY - 2010/4

Y1 - 2010/4

N2 - There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). In this study, the analytical performance of the total reflection X-ray fluorescence spectrometry for determination of fluorine was investigated applying a spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a silicon drift detector (SDD) with ultra thin window was used. The detection limit for fluorine was found to be 5 mg L- 1 (equivalent to 10 ng absolute) in aqueous matrix. The linear range of the fluorine determination is between 15 and 500 mg L- 1, within this range the precision is below 10%. The matrix effects of the other halogens (chlorine, bromine and iodine), and sulfate were also investigated. It has been established that the upper allowed concentration limit of the above interfering elements is 100, 200, 50 and 100 mg L- 1 for Cl, Br, I and sulfate, respectively. Moreover, the role of the pre-siliconization of the quartz carrier plate was investigated. It was found, that the presence of the silicone results in poorer analytical performance, which can be explained by the thicker sample residue and stronger self-absorption of the fluorescent radiation.

AB - There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). In this study, the analytical performance of the total reflection X-ray fluorescence spectrometry for determination of fluorine was investigated applying a spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a silicon drift detector (SDD) with ultra thin window was used. The detection limit for fluorine was found to be 5 mg L- 1 (equivalent to 10 ng absolute) in aqueous matrix. The linear range of the fluorine determination is between 15 and 500 mg L- 1, within this range the precision is below 10%. The matrix effects of the other halogens (chlorine, bromine and iodine), and sulfate were also investigated. It has been established that the upper allowed concentration limit of the above interfering elements is 100, 200, 50 and 100 mg L- 1 for Cl, Br, I and sulfate, respectively. Moreover, the role of the pre-siliconization of the quartz carrier plate was investigated. It was found, that the presence of the silicone results in poorer analytical performance, which can be explained by the thicker sample residue and stronger self-absorption of the fluorescent radiation.

KW - Detection limit

KW - Fluorine

KW - Interference effects

KW - Linearity range

KW - TXRF

UR - http://www.scopus.com/inward/record.url?scp=77951123780&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77951123780&partnerID=8YFLogxK

U2 - 10.1016/j.sab.2010.02.019

DO - 10.1016/j.sab.2010.02.019

M3 - Article

VL - 65

SP - 287

EP - 290

JO - Spectrochimica Acta, Part B: Atomic Spectroscopy

JF - Spectrochimica Acta, Part B: Atomic Spectroscopy

SN - 0584-8547

IS - 4

ER -