Detection of faint X-ray spectral features using wavelength, energy, and spatial discrimination techniques

L. T. Hudson, J. D. Gillaspy, J. M. Pomeroy, C. I. Szabo, J. N. Tan, B. Radics, E. Takacs, C. T. Chantler, J. A. Kimpton, M. N. Kinnane, L. F. Smale

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We report here our methods and results of measurements of very low-signal X-ray spectra produced by highly charged ions in an electron beam ion trap (EBIT). A megapixel Si charge-coupled device (CCD) camera was used in a direct-detection, single-photon-counting mode to image spectra with a cylindrically bent Ge(2 2 0) crystal spectrometer. The resulting wavelength-dispersed spectra were then processed using several intrinsic features of CCD images and image-analysis techniques. We demonstrate the ability to clearly detect very faint spectral features that are on the order of the noise due to cosmic-ray background signatures in our images. These techniques remove extraneous signal due to muon tracks and other sources, and are coupled with the spectrometer wavelength dispersion and atomic-structure calculations of hydrogen-like Ti to identify the energy of a faint line that was not in evidence before applying the methods outlined here.

Original languageEnglish
Pages (from-to)33-36
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume580
Issue number1 SPEC. ISS.
DOIs
Publication statusPublished - Sep 21 2007

Keywords

  • CCD imaging
  • Cosmic ray removal
  • Crystal spectroscopy
  • Highly charged ions
  • X-ray spectroscopy

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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