Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements

K. Vanhoenacker, T. Dobrowiecki, J. Schoukens

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)

Abstract

In this paper multisine excitation signals are designed which will be used to detect and qualify the nonlinear distortions on FRF measurements, and this without making additional experiments. The kernel idea in this method is to apply well chosen periodic excitations where not all harmonics are excited. The nonexcited frequency lines are used to detect, qualify and quantify the nonlinear distortions, while the FRF is measured at the same time at the excited harmonics. Since not every multisine yields optimal results, this paper presents some signals by which the following purposes are accomplished: simplicity, robustness and a reliable nonlinear characterization.

Original languageEnglish
Title of host publicationConference Record - IEEE Instrumentation and Measurement Technology Conference
PublisherIEEE
Pages1254-1259
Number of pages6
Volume3
Publication statusPublished - 2000
EventIMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' - Baltimore, MD, USA
Duration: May 1 2000May 4 2000

Other

OtherIMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control'
CityBaltimore, MD, USA
Period5/1/005/4/00

Fingerprint

Nonlinear distortion
harmonics
excitation
Experiments

ASJC Scopus subject areas

  • Instrumentation

Cite this

Vanhoenacker, K., Dobrowiecki, T., & Schoukens, J. (2000). Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (Vol. 3, pp. 1254-1259). IEEE.

Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements. / Vanhoenacker, K.; Dobrowiecki, T.; Schoukens, J.

Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 3 IEEE, 2000. p. 1254-1259.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vanhoenacker, K, Dobrowiecki, T & Schoukens, J 2000, Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements. in Conference Record - IEEE Instrumentation and Measurement Technology Conference. vol. 3, IEEE, pp. 1254-1259, IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA, 5/1/00.
Vanhoenacker K, Dobrowiecki T, Schoukens J. Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements. In Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 3. IEEE. 2000. p. 1254-1259
Vanhoenacker, K. ; Dobrowiecki, T. ; Schoukens, J. / Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements. Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 3 IEEE, 2000. pp. 1254-1259
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