Design of a THz-based Sub-100-fs electron source

Szabolcs Turnár, Bálint Kovacs, József András Fulöp, Gábor Almási, János Hebling, Zoltán Tibai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

THz pulse-based particle manipulation [1, 2] and acceleration in vacuum [3] have been developed and realized in recent years. Employing radiation at THz frequencies means longer wavelengths by two orders of magnitude than in case of visible or near-infrared pulses. Thus, the interaction length with the particles can be extended and a good synchronism between the pulse and the particles is possible.

Original languageEnglish
Title of host publication2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728104690
DOIs
Publication statusPublished - Jun 2019
Event2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 - Munich, Germany
Duration: Jun 23 2019Jun 27 2019

Publication series

Name2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019

Conference

Conference2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
CountryGermany
CityMunich
Period6/23/196/27/19

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ASJC Scopus subject areas

  • Spectroscopy
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications

Cite this

Turnár, S., Kovacs, B., Fulöp, J. A., Almási, G., Hebling, J., & Tibai, Z. (2019). Design of a THz-based Sub-100-fs electron source. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 [8872582] (2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOE-EQEC.2019.8872582