Design for thermal testability (DfTT) and a CMOS realization

V. Székely, Cs Márta, M. Rencz, Zs Benedek, B. Courtois

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The paper presents the idea of design for thermal testability (DfTT) of electronic or microelectromechanical systems (MEMS). The suggested method enables both on-line and off-line thermal monitoring of systems provided with DfTT circuitry, A CMOS-compatible digital-output temperature sensor, the key element of the required circuitry, is presented with experimental results. Sensor placement and result readout strategies are discussed and evaluated.

Original languageEnglish
Pages (from-to)29-33
Number of pages5
JournalSensors and Actuators: A. Physical
Volume55
Issue number1
DOIs
Publication statusPublished - Jul 15 1996

Fingerprint

CMOS
temperature sensors
microelectromechanical systems
readout
Temperature sensors
MEMS
output
sensors
electronics
Monitoring
Sensors
Hot Temperature

Keywords

  • Designs for thermal testability
  • Thermal testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Instrumentation

Cite this

Design for thermal testability (DfTT) and a CMOS realization. / Székely, V.; Márta, Cs; Rencz, M.; Benedek, Zs; Courtois, B.

In: Sensors and Actuators: A. Physical, Vol. 55, No. 1, 15.07.1996, p. 29-33.

Research output: Contribution to journalArticle

Székely, V. ; Márta, Cs ; Rencz, M. ; Benedek, Zs ; Courtois, B. / Design for thermal testability (DfTT) and a CMOS realization. In: Sensors and Actuators: A. Physical. 1996 ; Vol. 55, No. 1. pp. 29-33.
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