Dendrite material identification method using fractal analysis

Cs Dominkovics, G. Harsányi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

In this study an alternative way has been investigated in order to make the identification of dendrites caused failures easier. Dendrites grown during electrochemical migration (ECM) can cause shortages which can lead to catastrophic failures. ECM is a simple transport process, it can be described with electrochemical principles. Dendrites are metal or metal-oxide structures which grow from the cathode electrode towards the anode electrode. Furthermore dendrites are natural fractal phenomena. On the other hand, dendrites as fractal objects have differently defined dimension values. The so called box dimension is widely applied to characterize the structure of fractals. Box dimension of dendrites can be calculated with the simple box calculating algorithm and with similar procedures. One way to detect shortages is the automatic optical inspection. It is worth to examine the shape and form of these shortages. In this paper the identification of dendrites caused failures is discussed. The first step is short-detection, the second step is taking optical photomicrographs - pictures editing and the third step is calculating fractal dimensions. Fractal dimensions are material specific properties. If we know the fractal dimension of a shortage, we can determine the material which it is grown from. In view of this information we can guard against shortages for example with special coatings or new printed wiring board (PWB) layout design.

Original languageEnglish
Title of host publicationISSE 2010 - 33rd International Spring Seminar on Electronics Technology
Subtitle of host publicationPolymer Electronics and Nanotechnologies: Towards System Integration - Conference Proceedings
Pages200-203
Number of pages4
DOIs
Publication statusPublished - Sep 28 2010
Event33rd International Spring Seminar on Electronics Technology: Polymer Electronics and Nanotechnologies: Towards System Integration, ISSE 2010 - Warsaw, Poland
Duration: May 12 2010May 16 2010

Publication series

NameISSE 2010 - 33rd International Spring Seminar on Electronics Technology: Polymer Electronics and Nanotechnologies: Towards System Integration - Conference Proceedings

Other

Other33rd International Spring Seminar on Electronics Technology: Polymer Electronics and Nanotechnologies: Towards System Integration, ISSE 2010
CountryPoland
CityWarsaw
Period5/12/105/16/10

    Fingerprint

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Dominkovics, C., & Harsányi, G. (2010). Dendrite material identification method using fractal analysis. In ISSE 2010 - 33rd International Spring Seminar on Electronics Technology: Polymer Electronics and Nanotechnologies: Towards System Integration - Conference Proceedings (pp. 200-203). [5547287] (ISSE 2010 - 33rd International Spring Seminar on Electronics Technology: Polymer Electronics and Nanotechnologies: Towards System Integration - Conference Proceedings). https://doi.org/10.1109/ISSE.2010.5547287