Defects caused by high-energy ion beams, as measured by scanning probe methods

L. Bíró, J. Gyulai, G. Márk, Cs S. Daróczi

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Scanning probe methods reveal new effects in the study of solids irradiated with 'swift' heavy ions, i.e. with ions of extremely high energy (> 20 MeV/nucleon). A synergism of electronic and nuclear stopping mechanisms has been found; on irradiated highly oriented pyrolytic graphite, the formation of carbon nanotubes was observed. In the present paper, an example of modeling of scanning tunneling microscopy and some of the problems in understanding SPT images is also presented.

Original languageEnglish
Pages (from-to)245-254
Number of pages10
JournalMicron
Volume30
Issue number3
DOIs
Publication statusPublished - Jun 1999

Fingerprint

Scanning Tunnelling Microscopy
Image understanding
Heavy Ions
Carbon Nanotubes
Graphite
pyrolytic graphite
Scanning tunneling microscopy
Heavy ions
stopping
Ion beams
scanning tunneling microscopy
Carbon nanotubes
heavy ions
ion beams
carbon nanotubes
Ions
Scanning
Defects
scanning
defects

Keywords

  • Atomic force microscopy
  • Ion-beam damage
  • Scanning tunneling microscopy

ASJC Scopus subject areas

  • Cell Biology
  • Materials Science(all)
  • Instrumentation

Cite this

Defects caused by high-energy ion beams, as measured by scanning probe methods. / Bíró, L.; Gyulai, J.; Márk, G.; Daróczi, Cs S.

In: Micron, Vol. 30, No. 3, 06.1999, p. 245-254.

Research output: Contribution to journalArticle

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