DLTS and capacitance single-shot measurements were used to collect information on characteristically non-exponential levels in GaAsP and GaP. It is concluded that the non-exponentialities cannot be explained as collective phenomenon or the response of different independent deep levels. Using accurate single-shot capacitance decay data numerical curve fitting procedure showed that a) the actual trap concentration is underestimated by more than a factor of two if DLTS height is evaluated in the usual way: b) the trap activation energy is significantly overestimated as compared to the usual Arrhenius plot data if the effect of the inherent non-exponential thermal kinetics of these traps is not accounted for.
ASJC Scopus subject areas
- Nuclear and High Energy Physics