Deep level studies on traps showing non-exponential kinetics in GaAsP and GaP

L. Dózsa, G. Ferenczi

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Abstract

DLTS and capacitance single-shot measurements were used to collect information on characteristically non-exponential levels in GaAsP and GaP. It is concluded that the non-exponentialities cannot be explained as collective phenomenon or the response of different independent deep levels. Using accurate single-shot capacitance decay data numerical curve fitting procedure showed that a) the actual trap concentration is underestimated by more than a factor of two if DLTS height is evaluated in the usual way: b) the trap activation energy is significantly overestimated as compared to the usual Arrhenius plot data if the effect of the inherent non-exponential thermal kinetics of these traps is not accounted for.

Original languageEnglish
Pages (from-to)449-457
Number of pages9
JournalActa Physica Academiae Scientiarum Hungaricae
Volume51
Issue number4
DOIs
Publication statusPublished - Jul 1 1981

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ASJC Scopus subject areas

  • Nuclear and High Energy Physics

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