DARK RECOVERY OF FATIGUED PL CENTERS DURING FATIGUING IN AMORPHOUS Ge-Se SYSTEM.

M. Koós, I. Pócsik, Istvan Kosa Somogyi

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Dark recovery of fatigued photoluminescence intensity have been studied. Two types of fatigued centers have been detected, one is dark-restorable, the other is not. These centers need different exposition to be fatigued.

Original languageEnglish
Title of host publicationKey Eng Mater
Pages825-828
Number of pages4
Volume13
Editionpt 3
Publication statusPublished - 1986
EventInt Conf on Met and Semicond Glasses (MSG-86) - Hyderabad, India
Duration: Dec 16 1986Dec 20 1986

Other

OtherInt Conf on Met and Semicond Glasses (MSG-86)
CityHyderabad, India
Period12/16/8612/20/86

Fingerprint

Photoluminescence
Recovery

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Koós, M., Pócsik, I., & Kosa Somogyi, I. (1986). DARK RECOVERY OF FATIGUED PL CENTERS DURING FATIGUING IN AMORPHOUS Ge-Se SYSTEM. In Key Eng Mater (pt 3 ed., Vol. 13, pp. 825-828)

DARK RECOVERY OF FATIGUED PL CENTERS DURING FATIGUING IN AMORPHOUS Ge-Se SYSTEM. / Koós, M.; Pócsik, I.; Kosa Somogyi, Istvan.

Key Eng Mater. Vol. 13 pt 3. ed. 1986. p. 825-828.

Research output: Chapter in Book/Report/Conference proceedingChapter

Koós, M, Pócsik, I & Kosa Somogyi, I 1986, DARK RECOVERY OF FATIGUED PL CENTERS DURING FATIGUING IN AMORPHOUS Ge-Se SYSTEM. in Key Eng Mater. pt 3 edn, vol. 13, pp. 825-828, Int Conf on Met and Semicond Glasses (MSG-86), Hyderabad, India, 12/16/86.
Koós M, Pócsik I, Kosa Somogyi I. DARK RECOVERY OF FATIGUED PL CENTERS DURING FATIGUING IN AMORPHOUS Ge-Se SYSTEM. In Key Eng Mater. pt 3 ed. Vol. 13. 1986. p. 825-828
Koós, M. ; Pócsik, I. ; Kosa Somogyi, Istvan. / DARK RECOVERY OF FATIGUED PL CENTERS DURING FATIGUING IN AMORPHOUS Ge-Se SYSTEM. Key Eng Mater. Vol. 13 pt 3. ed. 1986. pp. 825-828
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