Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law-Johnson-noise secure key exchange

Yessica Saez, Laszlo B. Kish, Robert Mingesz, Zoltan Gingl, Claes G. Granqvist

Research output: Contribution to journalArticle

10 Citations (Scopus)


We classify and analyze bit errors in the current measurement mode of the Kirchhoff-law-Johnson-noise (KLJN) key distribution. The error probability decays exponentially with increasing bit exchange period and fixed bandwidth, which is similar to the error probability decay in the voltage measurement mode. We also analyze the combination of voltage and current modes for error removal. In this combination method, the error probability is still an exponential function that decays with the duration of the bit exchange period, but it has superior fidelity to the former schemes.

Original languageEnglish
Pages (from-to)271-277
Number of pages7
JournalJournal of Computational Electronics
Issue number1
Publication statusPublished - Mar 1 2014



  • Information theoretic security
  • Second Law of Thermodynamics
  • Secure key distribution via wire
  • Statistical physical key distribution
  • Unconditional security

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Modelling and Simulation
  • Electrical and Electronic Engineering

Cite this