Crystallization behavior and structure of amorphous Ge15Te 85 and Ge20Te80 alloys

W. Hoyer, I. Kaban, P. Jóvári, E. Dost

Research output: Contribution to journalArticle

17 Citations (Scopus)


Crystallization behavior of the amorphous Ge15Te85 and Ge20Te80 alloys under heat treatment has been studied by means of differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The structure of the amorphous germanium tellurides has been investigated with high-energy synchrotron radiation. Based on an analysis of DSC and XRD results, a plausible model of the structure of the Ge15Te85 and Ge20Te80 glasses is considered. Atomic distribution in the investigated Ge-Te amorphous alloys is simulated by means of the Reverse Monte Carlo technique.

Original languageEnglish
Pages (from-to)565-568
Number of pages4
JournalJournal of Non-Crystalline Solids
Issue number1 SPEC. ISS.
Publication statusPublished - Jun 15 2004

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Crystallization behavior and structure of amorphous Ge<sub>15</sub>Te <sub>85</sub> and Ge<sub>20</sub>Te<sub>80</sub> alloys'. Together they form a unique fingerprint.

  • Cite this