Crystal-field excitations in NiO studied with hard x-ray resonant inelastic x-ray scattering at the NiK edge

Simo Huotari, Tuomas Pylkkänen, G. Vankó, Roberto Verbeni, Pieter Glatzel, Giulio Monaco

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

Charge-neutral dd excitations in NiO have been studied using resonant inelastic x-ray scattering (RIXS) at the quadrupolar pre-edge of the NiK absorption edge (8331 eV) with an energy resolution of 250 meV. The results agree well with calculations performed using the atomic multiplet model for the Ni2+ ion including crystal-field effects. Most notably the first t2g → eg excitation at 1.05 eV was observed clearly and its energy determined with a high accuracy. The remaining differences between the theoretical and the experimental results, especially in the incident-photon-energy dependence, are suggested to be due to lattice distortions. This study demonstrates that bulk sensitive, high-resolution hard-x-ray RIXS can open up possibilities in studies of highly correlated materials.

Original languageEnglish
Article number041102
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume78
Issue number4
DOIs
Publication statusPublished - Jul 11 2008

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x ray scattering
crystal field theory
inelastic scattering
Scattering
X rays
Crystals
excitation
x rays
energy
Photons
fine structure
Ions
high resolution
photons
ions

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Crystal-field excitations in NiO studied with hard x-ray resonant inelastic x-ray scattering at the NiK edge. / Huotari, Simo; Pylkkänen, Tuomas; Vankó, G.; Verbeni, Roberto; Glatzel, Pieter; Monaco, Giulio.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 78, No. 4, 041102, 11.07.2008.

Research output: Contribution to journalArticle

Huotari, Simo ; Pylkkänen, Tuomas ; Vankó, G. ; Verbeni, Roberto ; Glatzel, Pieter ; Monaco, Giulio. / Crystal-field excitations in NiO studied with hard x-ray resonant inelastic x-ray scattering at the NiK edge. In: Physical Review B - Condensed Matter and Materials Physics. 2008 ; Vol. 78, No. 4.
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