Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron x-ray reflectometry

E. Szilágyi, L. Bottyán, L. Deák, E. Gerdau, V. N. Gittsovich, A. Gróf, E. Kótai, O. Leupold, D. L. Nagy, V. G. Semenov

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Rutherford backscattering and synchrotron x-ray reflectometry was used to analyse the depth profile of elements in a sputtered iron thin film of originally 20 nm thickness following corrosion heat treatments. An "up to self-consistency" simultaneous evaluation of both kinds of spectra allowed for accurate determination both elemental composition and thickness of the sub-layers. Different iron oxide and oxi-hydroxide layers were identified on top of the iron layer depending on the treatment. An oxide layer of overall composition close to Fe2O3 was also observed at the iron/glass interface.

Original languageEnglish
Pages (from-to)365-368
Number of pages4
JournalMaterials Science Forum
Volume248-249
Publication statusPublished - 1997

Fingerprint

Rutherford backscattering spectroscopy
Synchrotrons
Spectrometry
backscattering
corrosion
synchrotrons
Iron
Corrosion
X rays
profiles
iron
spectroscopy
x rays
Chemical analysis
Iron oxides
Oxides
Heat treatment
iron oxides
hydroxides
Glass

Keywords

  • Corrosion
  • Depth Profiling
  • Rutherford Backscattering
  • Synchrotron Radiation
  • Thin Films
  • X-Ray Reflectometry

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Szilágyi, E., Bottyán, L., Deák, L., Gerdau, E., Gittsovich, V. N., Gróf, A., ... Semenov, V. G. (1997). Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron x-ray reflectometry. Materials Science Forum, 248-249, 365-368.

Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron x-ray reflectometry. / Szilágyi, E.; Bottyán, L.; Deák, L.; Gerdau, E.; Gittsovich, V. N.; Gróf, A.; Kótai, E.; Leupold, O.; Nagy, D. L.; Semenov, V. G.

In: Materials Science Forum, Vol. 248-249, 1997, p. 365-368.

Research output: Contribution to journalArticle

Szilágyi, E, Bottyán, L, Deák, L, Gerdau, E, Gittsovich, VN, Gróf, A, Kótai, E, Leupold, O, Nagy, DL & Semenov, VG 1997, 'Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron x-ray reflectometry', Materials Science Forum, vol. 248-249, pp. 365-368.
Szilágyi, E. ; Bottyán, L. ; Deák, L. ; Gerdau, E. ; Gittsovich, V. N. ; Gróf, A. ; Kótai, E. ; Leupold, O. ; Nagy, D. L. ; Semenov, V. G. / Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron x-ray reflectometry. In: Materials Science Forum. 1997 ; Vol. 248-249. pp. 365-368.
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