Correlation between texture and average grain size in polycrystalline Ag thin films

M. Adamik, P. Barna, I. Tomov

Research output: Contribution to journalArticle

43 Citations (Scopus)

Abstract

The texture and average grain size are investigated in series of silver thin films deposited at various substrate temperatures and different vacuum conditions, by introducing the `structure curve', which describes their correlation. Its slope gives information on the relative contribution of normal and abnormal grain growth to the structure evolution. In contaminated films normal grain growth is suppressed. The texture sharpness has a maximum both in clean and contaminated films above 200 °C. This maximum corresponds to 1 and 0.5 μm average grain size in clean and contaminated films, respectively.

Original languageEnglish
Pages (from-to)33-38
Number of pages6
JournalThin Solid Films
Volume359
Issue number1
DOIs
Publication statusPublished - Jan 24 2000

Fingerprint

textures
Textures
grain size
Grain growth
Thin films
thin films
sharpness
Silver
silver
Vacuum
slopes
vacuum
Substrates
curves
Temperature
temperature

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Correlation between texture and average grain size in polycrystalline Ag thin films. / Adamik, M.; Barna, P.; Tomov, I.

In: Thin Solid Films, Vol. 359, No. 1, 24.01.2000, p. 33-38.

Research output: Contribution to journalArticle

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