Conversion electron Mössbauer and XPS study on the effect of polishing of a stainless steel sample

Cs Vértes, G. Vass, E. Kuzmann, K. Romhányi, M. Lakatos-Varsányi, A. Vértes

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Conversion electron Mössbauer spectroscopy (CEMS) and XPS has been used for the surface analysis of an "X10CrNiTi 18/9 (DIN 1.7440)"-type stainless steel in order to determine the supposed structural and/or chemical changes in the surface layer caused by polishing. Both, CEMS and XPS results can be associated with the appearance of Fe nitride in the outer layer of steel samples after polishing, while no sign of nitrogen was detected in the bulk material.

Original languageEnglish
Pages (from-to)447-454
Number of pages8
JournalJournal of Radioanalytical and Nuclear Chemistry
Volume186
Issue number6
DOIs
Publication statusPublished - Apr 1994

Fingerprint

Electron spectroscopy
Stainless Steel
Polishing
Spectrum Analysis
Stainless steel
X ray photoelectron spectroscopy
Electrons
Steel
Surface analysis
Nitrides
Nitrogen

ASJC Scopus subject areas

  • Nuclear Energy and Engineering
  • Inorganic Chemistry
  • Analytical Chemistry

Cite this

Conversion electron Mössbauer and XPS study on the effect of polishing of a stainless steel sample. / Vértes, Cs; Vass, G.; Kuzmann, E.; Romhányi, K.; Lakatos-Varsányi, M.; Vértes, A.

In: Journal of Radioanalytical and Nuclear Chemistry, Vol. 186, No. 6, 04.1994, p. 447-454.

Research output: Contribution to journalArticle

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