Concentration profile determination by pixe analysis utilizing the variation of beam energy

J. Végh, D. Berényi, E. Koltay, I. Kiss, S. Seif El-Nasr, L. Sarkadi

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Abstract

The applicability of the PIXE method by varying the beam energy for in-depth analysis was investigated. The measurements were carried out on different Al samples containing Zn and Mg, annealed during different time periods. The Zn concentration profiles for samples with different annealing were determined up to 30 μm. The method has a relatively poor depth resolution but its advantages (non-destructive multi-elemental method, applicable for a wide range of elements) make it useful especially in connection with some other profiling methods.

Original languageEnglish
Pages (from-to)553-555
Number of pages3
JournalNuclear instruments and methods
Volume153
Issue number2-3
DOIs
Publication statusPublished - Jul 15 1978

ASJC Scopus subject areas

  • Medicine(all)

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