Comparison of two alternative junction temperature setting methods aimed for thermal and optical testing of high power LEDs

Marton C. Bein, Janos Hegedus, Gusztav Hantos, Lajos Gaal, Gabor Farkas, M. Rencz, A. Poppe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Abstract

Characterization of LEDs and other semiconductor devices demands at least accurate monitoring of the junction temperature (Tj), also its control in more complex cases. In practical LED lighting appliances 'hot lumens' are meaningful, as most lamps are used in steady state with power applied. Analysis in cold state provides only indirect information about the intended operation. On the other hand, direct Tj measurement is not trivial - the most viable way is to measure the forward voltage (VF) which is a function of junction temperature. In this paper we compare two ways of VF-based Tj regulation of LEDs capable for electrical-optical-thermal characterization in a single session in terms of accuracy and time consumption.

Original languageEnglish
Title of host publicationTHERMINIC 2017 - 23rd International Workshop on Thermal Investigations of ICs and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
Volume2017-January
ISBN (Electronic)9781538619285
DOIs
Publication statusPublished - Dec 21 2017
Event23rd International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2017 - Amsterdam, Netherlands
Duration: Sep 27 2017Sep 29 2017

Other

Other23rd International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2017
CountryNetherlands
CityAmsterdam
Period9/27/179/29/17

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Modelling and Simulation
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Comparison of two alternative junction temperature setting methods aimed for thermal and optical testing of high power LEDs'. Together they form a unique fingerprint.

  • Cite this

    Bein, M. C., Hegedus, J., Hantos, G., Gaal, L., Farkas, G., Rencz, M., & Poppe, A. (2017). Comparison of two alternative junction temperature setting methods aimed for thermal and optical testing of high power LEDs. In THERMINIC 2017 - 23rd International Workshop on Thermal Investigations of ICs and Systems (Vol. 2017-January, pp. 1-4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/THERMINIC.2017.8233838