Comparison of JEDEC dynamic and static test methods for the thermal characterization of power LEDs

Andras Vass-Varnai, John Parry, Gergely Toth, Sandor Ress, Gabor Farkas, Andras Poppe, Marta Rencz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this paper we review the history of the static (continuous) and dynamic (pulsed) test methods described in JEDEC JESD51-1 [1]. Written in 1995, there has not been, to date and to the knowledge of the authors, any systematic review to these different approaches to the transient thermal testing of packaged ICs and LEDs. Commercially available and in-house test equipment perform either transient thermal testing according to one approach or the other, but not both.

Original languageEnglish
Title of host publicationProceedings of the 2012 IEEE 14th Electronics Packaging Technology Conference, EPTC 2012
Pages594-597
Number of pages4
DOIs
Publication statusPublished - Dec 1 2012
Event2012 IEEE 14th Electronics Packaging Technology Conference, EPTC 2012 - Singapore, Singapore
Duration: Dec 5 2012Dec 7 2012

Publication series

NameProceedings of the 2012 IEEE 14th Electronics Packaging Technology Conference, EPTC 2012

Other

Other2012 IEEE 14th Electronics Packaging Technology Conference, EPTC 2012
CountrySingapore
CitySingapore
Period12/5/1212/7/12

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Vass-Varnai, A., Parry, J., Toth, G., Ress, S., Farkas, G., Poppe, A., & Rencz, M. (2012). Comparison of JEDEC dynamic and static test methods for the thermal characterization of power LEDs. In Proceedings of the 2012 IEEE 14th Electronics Packaging Technology Conference, EPTC 2012 (pp. 594-597). [6507151] (Proceedings of the 2012 IEEE 14th Electronics Packaging Technology Conference, EPTC 2012). https://doi.org/10.1109/EPTC.2012.6507151