Comparison of electron backscatter and x-ray diffraction techniques for measuring dislocation density in zircaloy-2

T. Skippon, L. Balogh, M. R. Daymond

Research output: Contribution to journalArticle

Abstract

Two methods for measuring dislocation density were applied to a series of plastically deformed tensile samples of Zircaloy-2. Samples subjected to plastic strains ranging from 4 to 17% along a variety of loading paths were characterized using both electron backscatter diffraction (EBSD) and synchrotron X-ray line profile analysis (LPA). It was found that the EBSDbased method gave results which were similar in magnitude to those obtained by LPA and followed a similar trend with increasing plastic strain. The effects of microscope parameters and post-processing of the EBSD data on dislocation density measurements are also discussed. The typical method for estimating uncertainty in dislocation density measured via EBSD was shown to be overly conservative, and a more realistic method of determining uncertainty is presented as an alternative.

Original languageEnglish
Pages (from-to)415-427
Number of pages13
JournalJournal of Applied Crystallography
Volume52
DOIs
Publication statusPublished - Jan 1 2019

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Electron diffraction
Diffraction
X-Rays
Electrons
X rays
Plastic deformation
Plastics
Uncertainty
Synchrotrons
Microscopes
X-Ray Diffraction
Processing

Keywords

  • Diffraction
  • Dislocations
  • EBSD
  • Electron backscatter diffraction
  • Plasticity
  • Zirconium

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

Cite this

Comparison of electron backscatter and x-ray diffraction techniques for measuring dislocation density in zircaloy-2. / Skippon, T.; Balogh, L.; Daymond, M. R.

In: Journal of Applied Crystallography, Vol. 52, 01.01.2019, p. 415-427.

Research output: Contribution to journalArticle

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