Comparing the sensitivity of four laser induced damage tests at 266 nm and 532 nm

T. Somoskoi, C. S. Vass, M. Mero, R. Mingesz, Z. Bozoki, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The techniques of visual inspection, scattered light measurement, and shock wave detection in air and in the sample material have been tested simultaneously on dielectric high reflectors using ns laser pulses.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2013
PagesJTh2A.61
Publication statusPublished - Nov 18 2013
EventCLEO: Science and Innovations, CLEO_SI 2013 - San Jose, CA, United States
Duration: Jun 9 2013Jun 14 2013

Publication series

NameCLEO: Science and Innovations, CLEO_SI 2013

Other

OtherCLEO: Science and Innovations, CLEO_SI 2013
CountryUnited States
CitySan Jose, CA
Period6/9/136/14/13

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ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

Cite this

Somoskoi, T., Vass, C. S., Mero, M., Mingesz, R., Bozoki, Z., & Osvay, K. (2013). Comparing the sensitivity of four laser induced damage tests at 266 nm and 532 nm. In CLEO: Science and Innovations, CLEO_SI 2013 (pp. JTh2A.61). (CLEO: Science and Innovations, CLEO_SI 2013).