Comparing the sensitivity of four laser induced damage tests at 266 nm and 532 nm

T. Somoskoi, Cs Vass, M. Mero, R. Mingesz, Z. Bozoki, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The techniques of visual inspection, scattered light measurement, and shock wave detection in air and in the sample material have been tested simultaneously on dielectric high reflectors using ns laser pulses.

Original languageEnglish
Title of host publication2013 Conference on Lasers and Electro-Optics, CLEO 2013
PublisherIEEE Computer Society
ISBN (Print)9781557529725
DOIs
Publication statusPublished - 2013
Event2013 Conference on Lasers and Electro-Optics, CLEO 2013 - San Jose, CA, United States
Duration: Jun 9 2013Jun 14 2013

Publication series

Name2013 Conference on Lasers and Electro-Optics, CLEO 2013

Other

Other2013 Conference on Lasers and Electro-Optics, CLEO 2013
CountryUnited States
CitySan Jose, CA
Period6/9/136/14/13

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Somoskoi, T., Vass, C., Mero, M., Mingesz, R., Bozoki, Z., & Osvay, K. (2013). Comparing the sensitivity of four laser induced damage tests at 266 nm and 532 nm. In 2013 Conference on Lasers and Electro-Optics, CLEO 2013 [6833862] (2013 Conference on Lasers and Electro-Optics, CLEO 2013). IEEE Computer Society. https://doi.org/10.1364/cleo_qels.2013.jth2a.61