Comparative investigation of Stöber silica langmuir-Blodgett films as optical model structures

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Mono- and multilayered Stöber silica Langmuir-Blodgett (LB) films were investigated by Spectroscopic Ellipsometry (SE) and Optical Waveguide Lightmode Spectroscopy (OWLS) comparatively. The effective refractive index and film thickness were determined from the results of multiparameter fitting of SE and OWLS spectra, and verified by reflectance spectroscopy measurements. LB layers of silica nanospheres are excellent model structures for the experimental verification of the validity of the Effective Medium Approximation (EMA) methods in SE evaluation. Since the structure of the LB films is nearly ideally close-packed, even single layer Maxwell-Garnett EMA offers a sufficiently adequate description of this structure. Deviation from the ideally calculated porosity in the LB monolayer can be interpreted in terms of an average distance between individual spheres (coverage) in the uniform layer (assuming monodisperse particles). In case of the evaluations of OWLS measurements homogeneous single layer model can not be used because of the exponential form of the sensing evanescent field.

Original languageEnglish
Pages (from-to)936-940
Number of pages5
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume205
Issue number4
DOIs
Publication statusPublished - Apr 2008

Fingerprint

Langmuir Blodgett films
Langmuir-Blodgett films
Model structures
Silicon Dioxide
Spectroscopic ellipsometry
Optical waveguides
Silica
Spectroscopy
optical waveguides
silicon dioxide
ellipsometry
spectroscopy
Evanescent fields
evaluation
Nanospheres
approximation
Film thickness
Monolayers
Refractive index
film thickness

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

@article{5165f5f2346c44e4b5cbfa47d98239a3,
title = "Comparative investigation of St{\"o}ber silica langmuir-Blodgett films as optical model structures",
abstract = "Mono- and multilayered St{\"o}ber silica Langmuir-Blodgett (LB) films were investigated by Spectroscopic Ellipsometry (SE) and Optical Waveguide Lightmode Spectroscopy (OWLS) comparatively. The effective refractive index and film thickness were determined from the results of multiparameter fitting of SE and OWLS spectra, and verified by reflectance spectroscopy measurements. LB layers of silica nanospheres are excellent model structures for the experimental verification of the validity of the Effective Medium Approximation (EMA) methods in SE evaluation. Since the structure of the LB films is nearly ideally close-packed, even single layer Maxwell-Garnett EMA offers a sufficiently adequate description of this structure. Deviation from the ideally calculated porosity in the LB monolayer can be interpreted in terms of an average distance between individual spheres (coverage) in the uniform layer (assuming monodisperse particles). In case of the evaluations of OWLS measurements homogeneous single layer model can not be used because of the exponential form of the sensing evanescent field.",
author = "N. Nagy and A. De{\'a}k and A. H{\'a}mori and Z. H{\'o}rv{\"o}lgyi and M. Fried and P. Petrik and I. B{\'a}rsony",
year = "2008",
month = "4",
doi = "10.1002/pssa.200777850",
language = "English",
volume = "205",
pages = "936--940",
journal = "Physica Status Solidi (A) Applications and Materials Science",
issn = "1862-6300",
publisher = "Wiley-VCH Verlag",
number = "4",

}

TY - JOUR

T1 - Comparative investigation of Stöber silica langmuir-Blodgett films as optical model structures

AU - Nagy, N.

AU - Deák, A.

AU - Hámori, A.

AU - Hórvölgyi, Z.

AU - Fried, M.

AU - Petrik, P.

AU - Bársony, I.

PY - 2008/4

Y1 - 2008/4

N2 - Mono- and multilayered Stöber silica Langmuir-Blodgett (LB) films were investigated by Spectroscopic Ellipsometry (SE) and Optical Waveguide Lightmode Spectroscopy (OWLS) comparatively. The effective refractive index and film thickness were determined from the results of multiparameter fitting of SE and OWLS spectra, and verified by reflectance spectroscopy measurements. LB layers of silica nanospheres are excellent model structures for the experimental verification of the validity of the Effective Medium Approximation (EMA) methods in SE evaluation. Since the structure of the LB films is nearly ideally close-packed, even single layer Maxwell-Garnett EMA offers a sufficiently adequate description of this structure. Deviation from the ideally calculated porosity in the LB monolayer can be interpreted in terms of an average distance between individual spheres (coverage) in the uniform layer (assuming monodisperse particles). In case of the evaluations of OWLS measurements homogeneous single layer model can not be used because of the exponential form of the sensing evanescent field.

AB - Mono- and multilayered Stöber silica Langmuir-Blodgett (LB) films were investigated by Spectroscopic Ellipsometry (SE) and Optical Waveguide Lightmode Spectroscopy (OWLS) comparatively. The effective refractive index and film thickness were determined from the results of multiparameter fitting of SE and OWLS spectra, and verified by reflectance spectroscopy measurements. LB layers of silica nanospheres are excellent model structures for the experimental verification of the validity of the Effective Medium Approximation (EMA) methods in SE evaluation. Since the structure of the LB films is nearly ideally close-packed, even single layer Maxwell-Garnett EMA offers a sufficiently adequate description of this structure. Deviation from the ideally calculated porosity in the LB monolayer can be interpreted in terms of an average distance between individual spheres (coverage) in the uniform layer (assuming monodisperse particles). In case of the evaluations of OWLS measurements homogeneous single layer model can not be used because of the exponential form of the sensing evanescent field.

UR - http://www.scopus.com/inward/record.url?scp=54849437594&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=54849437594&partnerID=8YFLogxK

U2 - 10.1002/pssa.200777850

DO - 10.1002/pssa.200777850

M3 - Article

VL - 205

SP - 936

EP - 940

JO - Physica Status Solidi (A) Applications and Materials Science

JF - Physica Status Solidi (A) Applications and Materials Science

SN - 1862-6300

IS - 4

ER -