Comments on "observation of the surface stress induced in microcantilevers by electrochemical redox processes" by F. Tian, J.H. Pei, D.L. Hedden, G.M. Brown, T. Thundat

Research output: Contribution to journalComment/debate

5 Citations (Scopus)

Abstract

Critical remarks have been formulated in connection with the surface stress measurements reported by Tian et al. It has been shown that due to the shortcomings of the experimental procedure some conclusions of the authors are hardly acceptable.

Original languageEnglish
Pages (from-to)330-332
Number of pages3
JournalUltramicroscopy
Volume104
Issue number3-4
DOIs
Publication statusPublished - Oct 2005

    Fingerprint

Keywords

  • Deflection
  • Microcantilever
  • Refraction
  • Schnell's law
  • Surface stress

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this