Combined application of ICES and XPS methods for quantitative electron spectroscopy of Tc compounds

L. Kövér, I. Cserny, M. Fiser, V. Brabec, O. Dragoun, J. Novak

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

XPS line profiles contain contributions from the core level, the spectrometer function, the exciting x-rays and - to various extents - contributions from different atomic, molecular and solid-state effects. The combined application of ICES (internal conversion electron spectroscopy) and XPS methods in electron spectroscopic analysis of Tc compounds gives an experimental way of determining these contributions separately by using adequate evaluation methods. ICES analysis of 99mTc compounds provides reference level widths and methods for determination of the spectrometer function as well as of the lineshape of the exciting photon spectrum, and these data and methods can be utilized in quantitative electron spectroscopy.

Original languageEnglish
Pages (from-to)215-216
Number of pages2
JournalSurface and Interface Analysis
Volume16
Issue number1-12
Publication statusPublished - Jul 1990

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Electron spectroscopy
internal conversion
electron spectroscopy
X ray photoelectron spectroscopy
Spectrometers
spectrometers
Spectroscopic analysis
Core levels
spectroscopic analysis
Photons
solid state
X rays
Electrons
evaluation
photons
profiles
electrons
x rays

ASJC Scopus subject areas

  • Colloid and Surface Chemistry

Cite this

Combined application of ICES and XPS methods for quantitative electron spectroscopy of Tc compounds. / Kövér, L.; Cserny, I.; Fiser, M.; Brabec, V.; Dragoun, O.; Novak, J.

In: Surface and Interface Analysis, Vol. 16, No. 1-12, 07.1990, p. 215-216.

Research output: Contribution to journalArticle

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