Abstract
XPS line profiles contain contributions from the core level, the spectrometer function, the exciting x-rays and - to various extents - contributions from different atomic, molecular and solid-state effects. The combined application of ICES (internal conversion electron spectroscopy) and XPS methods in electron spectroscopic analysis of Tc compounds gives an experimental way of determining these contributions separately by using adequate evaluation methods. ICES analysis of 99mTc compounds provides reference level widths and methods for determination of the spectrometer function as well as of the lineshape of the exciting photon spectrum, and these data and methods can be utilized in quantitative electron spectroscopy.
| Original language | English |
|---|---|
| Pages (from-to) | 215-216 |
| Number of pages | 2 |
| Journal | Surface and Interface Analysis |
| Volume | 16 |
| Issue number | 1-12 |
| Publication status | Published - Jul 1990 |
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ASJC Scopus subject areas
- Colloid and Surface Chemistry
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Combined application of ICES and XPS methods for quantitative electron spectroscopy of Tc compounds. / Kövér, L.; Cserny, I.; Fiser, M.; Brabec, V.; Dragoun, O.; Novak, J.
In: Surface and Interface Analysis, Vol. 16, No. 1-12, 07.1990, p. 215-216.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Combined application of ICES and XPS methods for quantitative electron spectroscopy of Tc compounds
AU - Kövér, L.
AU - Cserny, I.
AU - Fiser, M.
AU - Brabec, V.
AU - Dragoun, O.
AU - Novak, J.
PY - 1990/7
Y1 - 1990/7
N2 - XPS line profiles contain contributions from the core level, the spectrometer function, the exciting x-rays and - to various extents - contributions from different atomic, molecular and solid-state effects. The combined application of ICES (internal conversion electron spectroscopy) and XPS methods in electron spectroscopic analysis of Tc compounds gives an experimental way of determining these contributions separately by using adequate evaluation methods. ICES analysis of 99mTc compounds provides reference level widths and methods for determination of the spectrometer function as well as of the lineshape of the exciting photon spectrum, and these data and methods can be utilized in quantitative electron spectroscopy.
AB - XPS line profiles contain contributions from the core level, the spectrometer function, the exciting x-rays and - to various extents - contributions from different atomic, molecular and solid-state effects. The combined application of ICES (internal conversion electron spectroscopy) and XPS methods in electron spectroscopic analysis of Tc compounds gives an experimental way of determining these contributions separately by using adequate evaluation methods. ICES analysis of 99mTc compounds provides reference level widths and methods for determination of the spectrometer function as well as of the lineshape of the exciting photon spectrum, and these data and methods can be utilized in quantitative electron spectroscopy.
UR - http://www.scopus.com/inward/record.url?scp=0025464817&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0025464817&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0025464817
VL - 16
SP - 215
EP - 216
JO - Surface and Interface Analysis
JF - Surface and Interface Analysis
SN - 0142-2421
IS - 1-12
ER -