CO sensitivity of the PtO/SnO2 and PdO/SnO2 layer structures: Kelvin probe and XPS analysis

G. Kiss, K. Josepovits, K. Kovács, B. Ostrick, M. Fleischer, H. Meixner, F. Réti

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

The CO sensitivity of Pt(NH3)2(NO2)2 and Pd(NH3)2(NO2)2 impregnated SnO2 thick layers was measured by following the work function change, at 90 °C. The complexes were decomposed by heat treatments in air, in the temperature range of 150-350 °C. The composition of the surface layer was studied by XPS. The maximum CO sensitivity, the optimal response and recovery times-measured by Kelvin probe - were found, if PtO or PdO were present on the surface.

Original languageEnglish
Pages (from-to)115-118
Number of pages4
JournalThin Solid Films
Volume436
Issue number1
DOIs
Publication statusPublished - Jul 22 2003

Fingerprint

Carbon Monoxide
X ray photoelectron spectroscopy
probes
sensitivity
surface layers
heat treatment
recovery
Heat treatment
Recovery
air
Air
Chemical analysis
Temperature
temperature

Keywords

  • CO sensitivity
  • SnO
  • Work function
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

CO sensitivity of the PtO/SnO2 and PdO/SnO2 layer structures : Kelvin probe and XPS analysis. / Kiss, G.; Josepovits, K.; Kovács, K.; Ostrick, B.; Fleischer, M.; Meixner, H.; Réti, F.

In: Thin Solid Films, Vol. 436, No. 1, 22.07.2003, p. 115-118.

Research output: Contribution to journalArticle

Kiss, G. ; Josepovits, K. ; Kovács, K. ; Ostrick, B. ; Fleischer, M. ; Meixner, H. ; Réti, F. / CO sensitivity of the PtO/SnO2 and PdO/SnO2 layer structures : Kelvin probe and XPS analysis. In: Thin Solid Films. 2003 ; Vol. 436, No. 1. pp. 115-118.
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