Chemical effects on F KLL Auger spectra in fluorides

L. Kövér, M. Uda, I. Cserny, J. Tóth, J. Végh, D. Varga, K. Ogasawara, H. Adachi

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The satallite structures of F KLL Auger spectra in fluorides was studied for chemical effects. The Auger spectra were excited by x-rays coming from polycrystalline powder samples of fluorides of magnesium, nickel, zink and cobalt. An inverse proportionality was observed between Auger intensity ratio and satallite\diagram x-ray. The Auger intensity ratio was proportional to the linewidth of the new Auger satellite. The resonant nature of identified Auger transitions were indicated by the observations. Disrete variational molecular orbital calculations along with the experimental results were analysed on the basis of the resonance orbital rearrangement model to determine the energy difference.

Original languageEnglish
Pages (from-to)1143-1149
Number of pages7
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume19
Issue number4
DOIs
Publication statusPublished - Jul 2001

Fingerprint

chemical effects
Fluorides
fluorides
X rays
Orbital calculations
Molecular orbitals
Cobalt
Nickel
Linewidth
Powders
Magnesium
magnesium
molecular orbitals
x rays
cobalt
diagrams
nickel
Satellites
energy
magnesium fluoride

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Surfaces and Interfaces
  • Physics and Astronomy (miscellaneous)

Cite this

Chemical effects on F KLL Auger spectra in fluorides. / Kövér, L.; Uda, M.; Cserny, I.; Tóth, J.; Végh, J.; Varga, D.; Ogasawara, K.; Adachi, H.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 19, No. 4, 07.2001, p. 1143-1149.

Research output: Contribution to journalArticle

Kövér, L. ; Uda, M. ; Cserny, I. ; Tóth, J. ; Végh, J. ; Varga, D. ; Ogasawara, K. ; Adachi, H. / Chemical effects on F KLL Auger spectra in fluorides. In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 2001 ; Vol. 19, No. 4. pp. 1143-1149.
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