Characterization of the microstructure of severely deformed titanium by X-ray diffraction profile analysis

Jeno Gubicza, Iulianna C. Dragomir, Gábor Ribárik, Yuntian T. Zhu, Ruslan Valiev, Tamás Ungár

Research output: Contribution to journalConference article

18 Citations (Scopus)

Abstract

Nanocrystalline titanium was produced by equal channel angular pressing (ECAP). It was found that during ECAP a texture evolved in the specimen in which the hexagonal "c" axis is perpendicular to the extrusion direction. The crystallite size distribution and the dislocation structure were determined by fitting ab-initio theoretical functions to the Fourier coefficients of the measured X-ray diffraction peak profiles. The peak profile analysis provided the median and the variance of the crystallite size distribution: m=38 nm and σ=0.49, respectively. The dislocation slip system population was found to be 75% 〈a〉 type, 20% 〈c〉 type and 5% 〈c+a〉 type.

Original languageEnglish
Pages (from-to)229-234
Number of pages6
JournalMaterials Science Forum
Volume414-415
DOIs
Publication statusPublished - Jan 1 2003
Event3rd Hungarian Conference on Materials Science, Testing and Informatics - Balatonfured, Hungary
Duration: Oct 14 2001Oct 17 2001

Keywords

  • Crystallite size distribution
  • Dislocation structure
  • Plastic deformation
  • Titanium
  • X-ray peak profile analysis

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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