Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis

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Abstract

X-ray or neutron diffraction patterns are simulated by convoluting defect specific profile functions based on continuum theory of elasticity. The defect related profile functions are controlled by the physically mandatory minimum number of parameters: the dislocation density, ρ, the dislocation arrangement parameter, M, one or more parameters describing strain anisotropy where their number depends on the crystal symmetry, the median, m and the logarithmic variance, σ of the log-normal size distribution function, and finally the density of stacking faults, α or the frequency of twin boundaries, β. These parameters are, at the same time, among the most relevant physical parameters describing the microstructure of crystalline materials. The theoretical diffraction patterns are produced by the convolution of the defect related, physically based profile functions in the " extended Convolutional Multiple Whole Profile" (eCMWP) software package. The usage of the software package is demonstrated by the microstructure determination in randomly-textured and textured polycrystalline and single crystals specimens of different materials.

Original languageEnglish
Pages (from-to)112-121
Number of pages10
JournalMaterials Science and Engineering A
Volume528
Issue number1
DOIs
Publication statusPublished - Nov 25 2010

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Polycrystals
polycrystals
Diffraction
Single crystals
Software packages
Diffraction patterns
Defects
microstructure
Microstructure
single crystals
profiles
diffraction
crystals
Stacking faults
Crystal symmetry
Neutron diffraction
defects
Convolution
diffraction patterns
Distribution functions

Keywords

  • Dislocation structure
  • Planar defects
  • Strain anisotropy
  • Texture
  • X-ray line broadening

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

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title = "Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis",
abstract = "X-ray or neutron diffraction patterns are simulated by convoluting defect specific profile functions based on continuum theory of elasticity. The defect related profile functions are controlled by the physically mandatory minimum number of parameters: the dislocation density, ρ, the dislocation arrangement parameter, M, one or more parameters describing strain anisotropy where their number depends on the crystal symmetry, the median, m and the logarithmic variance, σ of the log-normal size distribution function, and finally the density of stacking faults, α or the frequency of twin boundaries, β. These parameters are, at the same time, among the most relevant physical parameters describing the microstructure of crystalline materials. The theoretical diffraction patterns are produced by the convolution of the defect related, physically based profile functions in the {"} extended Convolutional Multiple Whole Profile{"} (eCMWP) software package. The usage of the software package is demonstrated by the microstructure determination in randomly-textured and textured polycrystalline and single crystals specimens of different materials.",
keywords = "Dislocation structure, Planar defects, Strain anisotropy, Texture, X-ray line broadening",
author = "G. Rib{\'a}rik and T. Ung{\'a}r",
year = "2010",
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T1 - Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis

AU - Ribárik, G.

AU - Ungár, T.

PY - 2010/11/25

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N2 - X-ray or neutron diffraction patterns are simulated by convoluting defect specific profile functions based on continuum theory of elasticity. The defect related profile functions are controlled by the physically mandatory minimum number of parameters: the dislocation density, ρ, the dislocation arrangement parameter, M, one or more parameters describing strain anisotropy where their number depends on the crystal symmetry, the median, m and the logarithmic variance, σ of the log-normal size distribution function, and finally the density of stacking faults, α or the frequency of twin boundaries, β. These parameters are, at the same time, among the most relevant physical parameters describing the microstructure of crystalline materials. The theoretical diffraction patterns are produced by the convolution of the defect related, physically based profile functions in the " extended Convolutional Multiple Whole Profile" (eCMWP) software package. The usage of the software package is demonstrated by the microstructure determination in randomly-textured and textured polycrystalline and single crystals specimens of different materials.

AB - X-ray or neutron diffraction patterns are simulated by convoluting defect specific profile functions based on continuum theory of elasticity. The defect related profile functions are controlled by the physically mandatory minimum number of parameters: the dislocation density, ρ, the dislocation arrangement parameter, M, one or more parameters describing strain anisotropy where their number depends on the crystal symmetry, the median, m and the logarithmic variance, σ of the log-normal size distribution function, and finally the density of stacking faults, α or the frequency of twin boundaries, β. These parameters are, at the same time, among the most relevant physical parameters describing the microstructure of crystalline materials. The theoretical diffraction patterns are produced by the convolution of the defect related, physically based profile functions in the " extended Convolutional Multiple Whole Profile" (eCMWP) software package. The usage of the software package is demonstrated by the microstructure determination in randomly-textured and textured polycrystalline and single crystals specimens of different materials.

KW - Dislocation structure

KW - Planar defects

KW - Strain anisotropy

KW - Texture

KW - X-ray line broadening

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