Characterization of self-similar dislocation structures by X-ray diffraction

F. Székely, I. Groma, J. Lendvai

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The development of the statistical parameters of the dislocation structure during plastic deformation of copper single crystals (average dislocation density, and average dislocation density fluctuation) was investigated by the method of X-ray diffraction peak profile analysis. It is found that during the deformation process, while the dislocation density increases monotonically, the average fluctuation exhibits a maximum corresponding to the transition from stage II to stage III of work hardening. The fractal dimension of the dislocation structure was also investigated. A strong correlation was found between the fractal dimension and the relative dislocation density fluctuation.

Original languageEnglish
Pages (from-to)179-182
Number of pages4
JournalMaterials Science and Engineering A
Volume324
Issue number1-2
DOIs
Publication statusPublished - Feb 15 2002

Fingerprint

Dislocations (crystals)
Fractal dimension
X ray diffraction
diffraction
x rays
Strain hardening
Copper
fractals
Plastic deformation
Single crystals
work hardening
plastic deformation
copper
single crystals
profiles

Keywords

  • Dislocation patterning
  • Fractal dimension
  • Work hardening

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Characterization of self-similar dislocation structures by X-ray diffraction. / Székely, F.; Groma, I.; Lendvai, J.

In: Materials Science and Engineering A, Vol. 324, No. 1-2, 15.02.2002, p. 179-182.

Research output: Contribution to journalArticle

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