Characterization of self-similar dislocation patterns by x-ray diffraction

F. Székely, I. Groma, J. Lendvai

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

Copper single crystals deformed in uniaxial compression were investigated by x-ray line profile analysis, and the resulting statistical parameters of the developed dislocation pattern are compared to the fractal dimension of the dislocation network determined by the box-counting method on transmission electron microscope micrograph. The observed correlation between the relative fluctuation of the dislocation density and the fractal dimension of the dislocation pattern is interpreted on the basis of the generalized (fractal) composite model.

Original languageEnglish
Pages (from-to)3093-3098
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume62
Issue number5
Publication statusPublished - 2000

Fingerprint

Fractal dimension
Dislocations (crystals)
x ray diffraction
Diffraction
X rays
fractals
Fractals
Copper
Compaction
Electron microscopes
Single crystals
Composite materials
boxes
counting
electron microscopes
copper
composite materials
single crystals
profiles
x rays

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Characterization of self-similar dislocation patterns by x-ray diffraction. / Székely, F.; Groma, I.; Lendvai, J.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 62, No. 5, 2000, p. 3093-3098.

Research output: Contribution to journalArticle

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