Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering

I. M. Voynarovych, A. V. Gomonnai, A. M. Solomon, Yu M. Azhniuk, S. Kökényesi, V. P. Pinzenik, M. Kis-Varga, L. Daróczi, V. V. Lopushansky

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

X-ray diffraction and electron microscopy data show the crystal lattice structure and rod-like shape of SbSI nanocrystals obtained by ball milling to be similar to that of the bulk crystals. The dependence of the grain size on the milling duration is considered in view of the chain-like crystalline structure of SbSI. The observed Raman line broadening is discussed in the frame of confinement-related selection rules relaxation and scattering by surface phonons.

Original languageEnglish
Pages (from-to)713-718
Number of pages6
JournalJournal of Optoelectronics and Advanced Materials
Volume5
Issue number3
Publication statusPublished - Sep 2003

Fingerprint

Ball milling
Phonons
Crystal lattices
Nanocrystals
Electron microscopy
Raman scattering
electron microscopy
nanocrystals
Scattering
Raman spectra
Crystalline materials
X ray diffraction
Crystals
scattering
diffraction
crystal lattices
balls
phonons
x rays
rods

Keywords

  • Nanocrystals
  • Raman spectroscopy
  • Transmission electron microscopy
  • X-ray diffraction

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy (miscellaneous)

Cite this

Voynarovych, I. M., Gomonnai, A. V., Solomon, A. M., Azhniuk, Y. M., Kökényesi, S., Pinzenik, V. P., ... Lopushansky, V. V. (2003). Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering. Journal of Optoelectronics and Advanced Materials, 5(3), 713-718.

Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering. / Voynarovych, I. M.; Gomonnai, A. V.; Solomon, A. M.; Azhniuk, Yu M.; Kökényesi, S.; Pinzenik, V. P.; Kis-Varga, M.; Daróczi, L.; Lopushansky, V. V.

In: Journal of Optoelectronics and Advanced Materials, Vol. 5, No. 3, 09.2003, p. 713-718.

Research output: Contribution to journalArticle

Voynarovych, IM, Gomonnai, AV, Solomon, AM, Azhniuk, YM, Kökényesi, S, Pinzenik, VP, Kis-Varga, M, Daróczi, L & Lopushansky, VV 2003, 'Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering', Journal of Optoelectronics and Advanced Materials, vol. 5, no. 3, pp. 713-718.
Voynarovych, I. M. ; Gomonnai, A. V. ; Solomon, A. M. ; Azhniuk, Yu M. ; Kökényesi, S. ; Pinzenik, V. P. ; Kis-Varga, M. ; Daróczi, L. ; Lopushansky, V. V. / Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering. In: Journal of Optoelectronics and Advanced Materials. 2003 ; Vol. 5, No. 3. pp. 713-718.
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