Characterization of RuO2-based film electrodes by secondary ion mass spectrometry

Sergio Daolio, Bruno Facchin, Cesare Pagura, Achille De Battisti, Andrea Barbieri, Janós Kristóf

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10 Citations (Scopus)


Concentration depth profiles of Ti-supported RuO2-TiO 2 films, prepared by pyrolysis of ruthenium(III) chloride hydrate and titanium diisopropoxide bis-pentane-2,4-dionate, have been studied by secondary ion mass spectrometry (SIMS). The 102Ru:48Ti ion intensity ratio vs. the nominal concentration of ruthenium oxide was followed for samples obtained from precursors dissolved in different solvents. The dependence on bombarding time of ion intensity profiles for other species, such as O -(m/z = 16), OH- (m/z = 17), 46TiO + (m/z = 62), 50TiOH+ (m/z = 63) was also studied. The mixed oxide films were characterized by cyclic voltammetry. The results of the combined research support the idea that microstructural and chemical impurities are concentrated in the outermost part of the film. This phenomenon seems to depend on the composition of the solvent used for the precursor salts.

Original languageEnglish
Pages (from-to)1255-1258
Number of pages4
JournalJournal of Materials Chemistry
Issue number8
Publication statusPublished - Jan 1 1994

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Chemistry

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