Characterization of processing errors on analog fully-programmable cellular sensor-processor arrays

Stephen J. Carey, Akos Zarandy, Piotr Dudek

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Analog processor arrays, particularly for vision chips, have been in development for a number of years. Based normally on the SIMD computing paradigm, they achieve very high instruction parallelism through use of compact processing elements. A fundamental aspect of processor operation is the ability to copy content of a register to another. This operation carries with it a number of errors. This paper identifies these errors and provides the means by which they can be separated and measured. These techniques can then be applied to analyze any operation upon an analog processor array. The results from such an analysis reflect on the susceptibility of the circuit to process mismatch, and thermal and switch noise performance of a particular analog memory design.

Original languageEnglish
Title of host publication2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1580-1583
Number of pages4
ISBN (Print)9781479934324
DOIs
Publication statusPublished - Jan 1 2014
Event2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 - Melbourne, VIC, Australia
Duration: Jun 1 2014Jun 5 2014

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

Other2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014
CountryAustralia
CityMelbourne, VIC
Period6/1/146/5/14

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Carey, S. J., Zarandy, A., & Dudek, P. (2014). Characterization of processing errors on analog fully-programmable cellular sensor-processor arrays. In 2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 (pp. 1580-1583). [6865451] (Proceedings - IEEE International Symposium on Circuits and Systems). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCAS.2014.6865451