Characterization of non irradiated and heavily irradiated CVD diamond dosimeters

M. Bruzzi, M. Bucciolini, D. Menichelli, S. Pini, J. Molnar, A. Fenyvesi

Research output: Contribution to conferencePaper

Abstract

A Chemical Vapor Deposited (CVD) diamond film has been characterized as on-line dosimeter under irradiation with a Co60 gamma source in the dose range 0.1-1.0Gy. The current response is strongly influenced by trapping-detrapping effects due to the presence of defects in the polycrystalline bulk. To obtain a stable and reproducible signal the defect distribution has been opportunely changed by irradiating the sample with fast neutrons (1MeV) up to a fluence of 5×1014 n/cm2. The neutron irradiated sample show a linear response of the released charge as a function of the dose and of the current as a function of the dose-rate, with a sensitivity comparable with that of standard silicon dosimeters.

Original languageEnglish
Pages161-163
Number of pages3
Publication statusPublished - Dec 1 2001
Event2001 IEEE Nuclear Science Symposium Conference Record - San Diege, CA, United States
Duration: Nov 4 2001Nov 10 2001

Other

Other2001 IEEE Nuclear Science Symposium Conference Record
CountryUnited States
CitySan Diege, CA
Period11/4/0111/10/01

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ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Cite this

Bruzzi, M., Bucciolini, M., Menichelli, D., Pini, S., Molnar, J., & Fenyvesi, A. (2001). Characterization of non irradiated and heavily irradiated CVD diamond dosimeters. 161-163. Paper presented at 2001 IEEE Nuclear Science Symposium Conference Record, San Diege, CA, United States.