Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

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36 Citations (Scopus)

Abstract

X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials.

Original languageEnglish
Pages (from-to)567-579
Number of pages13
JournalZeitschrift fur Kristallographie
Volume222
Issue number11
DOIs
Publication statusPublished - 2007

Fingerprint

Nanocrystalline materials
Defect structures
nanocrystals
X rays
defects
profiles
x rays
Defects
Diamond
Stacking faults
Nanostructured materials
crystal defects
Diamonds
Polymers
grain size
diamonds
ceramics
Transmission electron microscopy
transmission electron microscopy
polymers

Keywords

  • Crystallite size
  • Dislocations
  • Nanomaterials
  • Planar defects
  • X-ray line profile analysis

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

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