Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Nanostructured Langmuir-Blodgett (LB) films of Stöber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.

Original languageEnglish
Title of host publicationMaterials Science, Testing and Informatics III - Proceedings of the 5th Hungarian Conference on Materials Science, Testing and Informatics
PublisherTrans Tech Publications Ltd
Pages329-336
Number of pages8
ISBN (Print)087849426X, 9780878494262
DOIs
Publication statusPublished - Jan 1 2007
Event5th Hungarian Conference on Materials Science, Testing and lnformatics - Balatonfured, Hungary
Duration: Oct 9 2005Oct 11 2005

Publication series

NameMaterials Science Forum
Volume537-538
ISSN (Print)0255-5476

Other

Other5th Hungarian Conference on Materials Science, Testing and lnformatics
CountryHungary
CityBalatonfured
Period10/9/0510/11/05

Keywords

  • Langmuir-Blodgett films
  • Scanning angle reflectometry
  • Stöber silica
  • UV-Vis spectroscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Deák, A., Hild, E., Kovács, A. L., & Hórvölgyi, Z. (2007). Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry. In Materials Science, Testing and Informatics III - Proceedings of the 5th Hungarian Conference on Materials Science, Testing and Informatics (pp. 329-336). (Materials Science Forum; Vol. 537-538). Trans Tech Publications Ltd. https://doi.org/10.4028/0-87849-426-x.329