Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Nanostructured Langmuir-Blodgett (LB) films of Stöber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.

Original languageEnglish
Title of host publicationMaterials Science Forum
Pages329-336
Number of pages8
Volume537-538
Publication statusPublished - 2007
Event5th Hungarian Conference on Materials Science, Testing and lnformatics - Balatonfured, Hungary
Duration: Oct 9 2005Oct 11 2005

Publication series

NameMaterials Science Forum
Volume537-538
ISSN (Print)02555476

Other

Other5th Hungarian Conference on Materials Science, Testing and lnformatics
CountryHungary
CityBalatonfured
Period10/9/0510/11/05

Fingerprint

Langmuir Blodgett films
Spectrometry
Refractive index
Scanning
Thin films
Quartz
Silicon
Ultraviolet spectroscopy
Silicon Dioxide
Film thickness
Optics
Volume fraction
Silica
Nanoparticles
Glass
Substrates

Keywords

  • Langmuir-Blodgett films
  • Scanning angle reflectometry
  • Stöber silica
  • UV-Vis spectroscopy

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Deák, A., Hild, E., Kovács, A., & Hórvölgyi, Z. (2007). Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry. In Materials Science Forum (Vol. 537-538, pp. 329-336). (Materials Science Forum; Vol. 537-538).

Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry. / Deák, A.; Hild, Erzsébet; Kovács, A.; Hórvölgyi, Z.

Materials Science Forum. Vol. 537-538 2007. p. 329-336 (Materials Science Forum; Vol. 537-538).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Deák, A, Hild, E, Kovács, A & Hórvölgyi, Z 2007, Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry. in Materials Science Forum. vol. 537-538, Materials Science Forum, vol. 537-538, pp. 329-336, 5th Hungarian Conference on Materials Science, Testing and lnformatics, Balatonfured, Hungary, 10/9/05.
@inproceedings{60e08a1a8b20464c8cf3a744535db2a5,
title = "Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry",
abstract = "Nanostructured Langmuir-Blodgett (LB) films of St{\"o}ber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.",
keywords = "Langmuir-Blodgett films, Scanning angle reflectometry, St{\"o}ber silica, UV-Vis spectroscopy",
author = "A. De{\'a}k and Erzs{\'e}bet Hild and A. Kov{\'a}cs and Z. H{\'o}rv{\"o}lgyi",
year = "2007",
language = "English",
isbn = "087849426X",
volume = "537-538",
series = "Materials Science Forum",
pages = "329--336",
booktitle = "Materials Science Forum",

}

TY - GEN

T1 - Characterisation of solid supported nanostructured thin films by scanning angle reflectometry and UV-Vis spectrometry

AU - Deák, A.

AU - Hild, Erzsébet

AU - Kovács, A.

AU - Hórvölgyi, Z.

PY - 2007

Y1 - 2007

N2 - Nanostructured Langmuir-Blodgett (LB) films of Stöber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.

AB - Nanostructured Langmuir-Blodgett (LB) films of Stöber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.

KW - Langmuir-Blodgett films

KW - Scanning angle reflectometry

KW - Stöber silica

KW - UV-Vis spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=38449094255&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=38449094255&partnerID=8YFLogxK

M3 - Conference contribution

SN - 087849426X

SN - 9780878494262

VL - 537-538

T3 - Materials Science Forum

SP - 329

EP - 336

BT - Materials Science Forum

ER -