Characterisation of carbon nanotube materials by Raman spectroscopy and microscopy - A case study of multiwalled and singlewalled samples

A. M. Keszler, L. Nemes, S. R. Ahmad, X. Fang

Research output: Contribution to journalArticle

51 Citations (Scopus)

Abstract

Laser excited Raman scattering was measured from various carbon nanotube samples, as well as high purity graphite using an Ar* laser at different wavelengths and the variation of the band parameters was studied as a function of the excitation laser wavelength. Features in the Raman scattering have been identified and assigned to known structural and dynamical sources. Scanning electron microscopic and tunnelling microscopic pictures of two different nanotube samples contributed to the characterization of the samples as multiwalled and singlewalled carbon nanotube bundles and helped identify Raman spectral features.

Original languageEnglish
Pages (from-to)1269-1274
Number of pages6
JournalJournal of Optoelectronics and Advanced Materials
Volume6
Issue number4
Publication statusPublished - Dec 2004

Fingerprint

Carbon Nanotubes
Raman spectroscopy
Raman scattering
Carbon nanotubes
Microscopic examination
carbon nanotubes
microscopy
Wavelength
Laser excitation
Graphite
Lasers
Nanotubes
Raman spectra
lasers
Scanning
wavelengths
bundles
Electrons
nanotubes
purity

Keywords

  • Carbon nanotube
  • Raman spectroscopy
  • Scanning electron microscopy
  • Tunneling microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy (miscellaneous)

Cite this

Characterisation of carbon nanotube materials by Raman spectroscopy and microscopy - A case study of multiwalled and singlewalled samples. / Keszler, A. M.; Nemes, L.; Ahmad, S. R.; Fang, X.

In: Journal of Optoelectronics and Advanced Materials, Vol. 6, No. 4, 12.2004, p. 1269-1274.

Research output: Contribution to journalArticle

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