CHANNELING EFFECTS IN POLYCRYSTALLINE COPPER - A SERIOUS IMPEDIMENT TO QUANTITATIVE AUGER ANALYSIS?

F. E. Doern, L. Kövér, N. S. McIntyre

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

Variation in absolute Auger intensity of as much as 40% are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.

Original languageEnglish
Pages (from-to)282-285
Number of pages4
JournalSurface and Interface Analysis
Volume6
Issue number6
Publication statusPublished - Dec 1984

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Copper
Electron beams
Scanning
copper
Electrons
electron beams
scanning
high resolution
electrons

ASJC Scopus subject areas

  • Colloid and Surface Chemistry
  • Physical and Theoretical Chemistry

Cite this

CHANNELING EFFECTS IN POLYCRYSTALLINE COPPER - A SERIOUS IMPEDIMENT TO QUANTITATIVE AUGER ANALYSIS? / Doern, F. E.; Kövér, L.; McIntyre, N. S.

In: Surface and Interface Analysis, Vol. 6, No. 6, 12.1984, p. 282-285.

Research output: Contribution to journalArticle

@article{bde48a6902014c95a9f35811c12311f5,
title = "CHANNELING EFFECTS IN POLYCRYSTALLINE COPPER - A SERIOUS IMPEDIMENT TO QUANTITATIVE AUGER ANALYSIS?",
abstract = "Variation in absolute Auger intensity of as much as 40{\%} are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.",
author = "Doern, {F. E.} and L. K{\"o}v{\'e}r and McIntyre, {N. S.}",
year = "1984",
month = "12",
language = "English",
volume = "6",
pages = "282--285",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "6",

}

TY - JOUR

T1 - CHANNELING EFFECTS IN POLYCRYSTALLINE COPPER - A SERIOUS IMPEDIMENT TO QUANTITATIVE AUGER ANALYSIS?

AU - Doern, F. E.

AU - Kövér, L.

AU - McIntyre, N. S.

PY - 1984/12

Y1 - 1984/12

N2 - Variation in absolute Auger intensity of as much as 40% are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.

AB - Variation in absolute Auger intensity of as much as 40% are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.

UR - http://www.scopus.com/inward/record.url?scp=0021594394&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0021594394&partnerID=8YFLogxK

M3 - Article

VL - 6

SP - 282

EP - 285

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 6

ER -