Abstract
Variation in absolute Auger intensity of as much as 40% are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.
| Original language | English |
|---|---|
| Pages (from-to) | 282-285 |
| Number of pages | 4 |
| Journal | Surface and Interface Analysis |
| Volume | 6 |
| Issue number | 6 |
| Publication status | Published - Dec 1984 |
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ASJC Scopus subject areas
- Colloid and Surface Chemistry
- Physical and Theoretical Chemistry
Cite this
CHANNELING EFFECTS IN POLYCRYSTALLINE COPPER - A SERIOUS IMPEDIMENT TO QUANTITATIVE AUGER ANALYSIS? / Doern, F. E.; Kövér, L.; McIntyre, N. S.
In: Surface and Interface Analysis, Vol. 6, No. 6, 12.1984, p. 282-285.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - CHANNELING EFFECTS IN POLYCRYSTALLINE COPPER - A SERIOUS IMPEDIMENT TO QUANTITATIVE AUGER ANALYSIS?
AU - Doern, F. E.
AU - Kövér, L.
AU - McIntyre, N. S.
PY - 1984/12
Y1 - 1984/12
N2 - Variation in absolute Auger intensity of as much as 40% are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.
AB - Variation in absolute Auger intensity of as much as 40% are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.
UR - http://www.scopus.com/inward/record.url?scp=0021594394&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0021594394&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0021594394
VL - 6
SP - 282
EP - 285
JO - Surface and Interface Analysis
JF - Surface and Interface Analysis
SN - 0142-2421
IS - 6
ER -