Carrier-envelope phase stability in a polarization-encoded Ti: Sa amplifier

Roland S. Nagymihaly, Huabao Cao, Peter Jojart, Mikhail Kalashnikov, Adam Borzsonyi, Vladimir Chvykov, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Polarization-encoded amplification in Ti:Sa was tested for CEP stability by using a common-path interferometer. CEP stability of the PE amplifier was compared to conventional Ti:Sa amplification and the effect of pump energy was also investigated.

Original languageEnglish
Title of host publicationAdvanced Solid State Lasers, ASSL 2017
PublisherOSA - The Optical Society
VolumePart F75-ASSL 2017
ISBN (Electronic)9781557528209
DOIs
Publication statusPublished - Jan 1 2017
EventAdvanced Solid State Lasers, ASSL 2017 - Nagoya, Japan
Duration: Oct 1 2017Oct 5 2017

Other

OtherAdvanced Solid State Lasers, ASSL 2017
CountryJapan
CityNagoya
Period10/1/1710/5/17

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Cite this

Nagymihaly, R. S., Cao, H., Jojart, P., Kalashnikov, M., Borzsonyi, A., Chvykov, V., & Osvay, K. (2017). Carrier-envelope phase stability in a polarization-encoded Ti: Sa amplifier. In Advanced Solid State Lasers, ASSL 2017 (Vol. Part F75-ASSL 2017). OSA - The Optical Society. https://doi.org/10.1364/ASSL.2017.AW1A.5