Carrier-envelope phase noise increment due to thermal issues of a Ti:Sapphire-based amplifier

A. Börzsönyi, R. S. Nagymihály, P. Jójárt, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Thermal instability-related noise of carrier-envelope phase (CEP) of pulses are measured in a three-pass amplifier separately from the oscillator, resulting in an increase of <100mrad noise depending on the repetition rate, cooling and pumping conditions.

Original languageEnglish
Title of host publicationMid-Infrared Coherent Sources, MICS 2013
Publication statusPublished - Dec 1 2013
EventMid-Infrared Coherent Sources, MICS 2013 - Paris, France
Duration: Oct 27 2013Nov 1 2013

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherMid-Infrared Coherent Sources, MICS 2013
CountryFrance
CityParis
Period10/27/1311/1/13

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ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Börzsönyi, A., Nagymihály, R. S., Jójárt, P., & Osvay, K. (2013). Carrier-envelope phase noise increment due to thermal issues of a Ti:Sapphire-based amplifier. In Mid-Infrared Coherent Sources, MICS 2013 (Optics InfoBase Conference Papers).