Carrier-envelop phase noise of ultrashort pulses in a Ti:Sapphire amplifier

A. Borzsonyi, R. S. Nagymihaly, P. Jojart, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The relative carrier-envelop phase (CEP) of pulses are measured at different repetition rates, gain, and saturation levels of a three-pass amplifier, resulting in an increase of <100mrad CEP noise depending on the amplification conditions.

Original languageEnglish
Title of host publication2013 Conference on Lasers and Electro-Optics, CLEO 2013
PublisherIEEE Computer Society
ISBN (Print)9781557529725
DOIs
Publication statusPublished - 2013
Event2013 Conference on Lasers and Electro-Optics, CLEO 2013 - San Jose, CA, United States
Duration: Jun 9 2013Jun 14 2013

Publication series

Name2013 Conference on Lasers and Electro-Optics, CLEO 2013

Other

Other2013 Conference on Lasers and Electro-Optics, CLEO 2013
CountryUnited States
CitySan Jose, CA
Period6/9/136/14/13

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Borzsonyi, A., Nagymihaly, R. S., Jojart, P., & Osvay, K. (2013). Carrier-envelop phase noise of ultrashort pulses in a Ti:Sapphire amplifier. In 2013 Conference on Lasers and Electro-Optics, CLEO 2013 [6833819] (2013 Conference on Lasers and Electro-Optics, CLEO 2013). IEEE Computer Society. https://doi.org/10.1364/cleo_qels.2013.jth2a.15