Calibration measurements down to 50nm with photon correlation nano LDA

Lenard Vamos, Peter Jani, A. Nagy, Dezso Szigethy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Photon correlation LDA was developed for process monitoring of nanoparticle fabrication. The system measures particle number, velocity and size of submicron particles simultaneously. The backscattering arrangement assures the online, in-situ, non-invasive measurements without further fine tuning. Compared to single particle counters the system works with much higher resolution in particle sizing and velocity measurements. High resolution measurements can be performed also in space and time to provide new insights in fundamental processes such as nanoparticle growth and motion. It was shown with monodisperse for silicon oxide particles in calibration measurements, that the lower detection limit is around 50nm and the size resolution is below 10nm.

Original languageEnglish
Title of host publicationProceedings of the IEEE Conference on Nanotechnology
DOIs
Publication statusPublished - 2012
Event2012 12th IEEE International Conference on Nanotechnology, NANO 2012 - Birmingham, United Kingdom
Duration: Aug 20 2012Aug 23 2012

Other

Other2012 12th IEEE International Conference on Nanotechnology, NANO 2012
CountryUnited Kingdom
CityBirmingham
Period8/20/128/23/12

Fingerprint

Photons
Calibration
photons
Nanoparticles
Radiation counters
Process monitoring
Silicon oxides
Backscattering
Velocity measurement
nanoparticles
radiation counters
high resolution
sizing
Tuning
silicon oxides
velocity measurement
Fabrication
backscattering
tuning
fabrication

ASJC Scopus subject areas

  • Bioengineering
  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Condensed Matter Physics

Cite this

Vamos, L., Jani, P., Nagy, A., & Szigethy, D. (2012). Calibration measurements down to 50nm with photon correlation nano LDA. In Proceedings of the IEEE Conference on Nanotechnology [6322213] https://doi.org/10.1109/NANO.2012.6322213

Calibration measurements down to 50nm with photon correlation nano LDA. / Vamos, Lenard; Jani, Peter; Nagy, A.; Szigethy, Dezso.

Proceedings of the IEEE Conference on Nanotechnology. 2012. 6322213.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vamos, L, Jani, P, Nagy, A & Szigethy, D 2012, Calibration measurements down to 50nm with photon correlation nano LDA. in Proceedings of the IEEE Conference on Nanotechnology., 6322213, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012, Birmingham, United Kingdom, 8/20/12. https://doi.org/10.1109/NANO.2012.6322213
Vamos L, Jani P, Nagy A, Szigethy D. Calibration measurements down to 50nm with photon correlation nano LDA. In Proceedings of the IEEE Conference on Nanotechnology. 2012. 6322213 https://doi.org/10.1109/NANO.2012.6322213
Vamos, Lenard ; Jani, Peter ; Nagy, A. ; Szigethy, Dezso. / Calibration measurements down to 50nm with photon correlation nano LDA. Proceedings of the IEEE Conference on Nanotechnology. 2012.
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