Calculation of surface self-diffusion coefficients from AES data on decay of thin metal films

I. Beszeda, D. Beke, E. G. Gontier-Moya, Yu S. Kaganovskii, D. Ianetz

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We propose a simple method for calculation of surface self-diffusion coefficients using kinetic data on the decay of thin films - void growth and transformation of the island shape to the equilibrium. Calculations are made taking into account equilibrium wetting angle of the film on a substrate. The kinetic data on the decay of Pd thin films on sapphire and silica substrates were obtained using Auger electron spectroscopy. By in situ monitoring the intensity of the Auger signal from the film, three different stages of the decay could be distinguished. The surface self-diffusion coefficients were calculated for the temperature range 583 - 823 K. The values of the surface diffusion coefficients and the activation energies are discussed compared to those obtained by other methods.

Original languageEnglish
Pages (from-to)727-732
Number of pages6
JournalDefect and Diffusion Forum
Volume237-240
Issue numberPART 2
Publication statusPublished - 2005

Fingerprint

surface diffusion
metal films
diffusion coefficient
Metals
decay
Thin films
Kinetics
Surface diffusion
Aluminum Oxide
kinetics
Substrates
Auger electron spectroscopy
thin films
Sapphire
Silicon Dioxide
Auger spectroscopy
wetting
electron spectroscopy
Wetting
voids

Keywords

  • Auger electron spectroscopy
  • Palladium
  • Sapphire
  • Surface self-diffusion
  • Thin films

ASJC Scopus subject areas

  • Metals and Alloys

Cite this

Beszeda, I., Beke, D., Gontier-Moya, E. G., Kaganovskii, Y. S., & Ianetz, D. (2005). Calculation of surface self-diffusion coefficients from AES data on decay of thin metal films. Defect and Diffusion Forum, 237-240(PART 2), 727-732.

Calculation of surface self-diffusion coefficients from AES data on decay of thin metal films. / Beszeda, I.; Beke, D.; Gontier-Moya, E. G.; Kaganovskii, Yu S.; Ianetz, D.

In: Defect and Diffusion Forum, Vol. 237-240, No. PART 2, 2005, p. 727-732.

Research output: Contribution to journalArticle

Beszeda, I, Beke, D, Gontier-Moya, EG, Kaganovskii, YS & Ianetz, D 2005, 'Calculation of surface self-diffusion coefficients from AES data on decay of thin metal films', Defect and Diffusion Forum, vol. 237-240, no. PART 2, pp. 727-732.
Beszeda I, Beke D, Gontier-Moya EG, Kaganovskii YS, Ianetz D. Calculation of surface self-diffusion coefficients from AES data on decay of thin metal films. Defect and Diffusion Forum. 2005;237-240(PART 2):727-732.
Beszeda, I. ; Beke, D. ; Gontier-Moya, E. G. ; Kaganovskii, Yu S. ; Ianetz, D. / Calculation of surface self-diffusion coefficients from AES data on decay of thin metal films. In: Defect and Diffusion Forum. 2005 ; Vol. 237-240, No. PART 2. pp. 727-732.
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