Calculation of IR reflection spectra of inhomogeneously doped semiconductors

E. Hild, A. Grofcsik

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

A computer program based on numerical solutions of the differential equation for the optical admittance has been developed for the calculation of i.r. reflection spectra of inhomogeneously doped semiconductor layers. Computed spectra are reported for different impurity profiles. A graphical method is suggested for two-parameter profiles to determine these parameters.

Original languageEnglish
Pages (from-to)23-33
Number of pages11
JournalInfrared Physics
Volume18
Issue number1
DOIs
Publication statusPublished - 1978

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Computer program listings
Differential equations
Impurities
Semiconductor materials
profiles
electrical impedance
differential equations
computer programs
impurities

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Calculation of IR reflection spectra of inhomogeneously doped semiconductors. / Hild, E.; Grofcsik, A.

In: Infrared Physics, Vol. 18, No. 1, 1978, p. 23-33.

Research output: Contribution to journalArticle

@article{cadc15f0dc8a457fb212b2b4816ad6c9,
title = "Calculation of IR reflection spectra of inhomogeneously doped semiconductors",
abstract = "A computer program based on numerical solutions of the differential equation for the optical admittance has been developed for the calculation of i.r. reflection spectra of inhomogeneously doped semiconductor layers. Computed spectra are reported for different impurity profiles. A graphical method is suggested for two-parameter profiles to determine these parameters.",
author = "E. Hild and A. Grofcsik",
year = "1978",
doi = "10.1016/0020-0891(78)90006-4",
language = "English",
volume = "18",
pages = "23--33",
journal = "Infrared Physics and Technology",
issn = "1350-4495",
publisher = "Elsevier",
number = "1",

}

TY - JOUR

T1 - Calculation of IR reflection spectra of inhomogeneously doped semiconductors

AU - Hild, E.

AU - Grofcsik, A.

PY - 1978

Y1 - 1978

N2 - A computer program based on numerical solutions of the differential equation for the optical admittance has been developed for the calculation of i.r. reflection spectra of inhomogeneously doped semiconductor layers. Computed spectra are reported for different impurity profiles. A graphical method is suggested for two-parameter profiles to determine these parameters.

AB - A computer program based on numerical solutions of the differential equation for the optical admittance has been developed for the calculation of i.r. reflection spectra of inhomogeneously doped semiconductor layers. Computed spectra are reported for different impurity profiles. A graphical method is suggested for two-parameter profiles to determine these parameters.

UR - http://www.scopus.com/inward/record.url?scp=0017918971&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0017918971&partnerID=8YFLogxK

U2 - 10.1016/0020-0891(78)90006-4

DO - 10.1016/0020-0891(78)90006-4

M3 - Article

VL - 18

SP - 23

EP - 33

JO - Infrared Physics and Technology

JF - Infrared Physics and Technology

SN - 1350-4495

IS - 1

ER -