Biased percolation and noise analysis of electrical breakdown

Z. Gingl, C. Pennetta, L. B. Kiss, L. Reggiani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present an extended investigation of the biased percolation model introduced since 1995 for the analysis of electrical breakdown and associated resistance fluctuations. The characterization of the degradation process before electrical breakdown is monitored by the evolution of the damage pattern, the current and temperature distributions, the macroscopic sample resistance, and its fluctuations. We study the conductor-insulator (CI) and conductor-superconductor (CS) like degradation processes by discussing their similarities and differences. The results compare well with available experiments, and can be used to propose good indicators for testing the reliability of samples thus providing a non-destructive tool of investigation.

Original languageEnglish
Title of host publicationProceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations
EditorsC. Claeys, E. Simoen
PublisherWorld Sci Publ Co Pte Ltd
Pages409-414
Number of pages6
Publication statusPublished - 1997
EventProceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations - Leuven, Belgium
Duration: Jul 14 1997Jul 18 1997

Other

OtherProceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations
CityLeuven, Belgium
Period7/14/977/18/97

Fingerprint

Degradation
Superconducting materials
Temperature distribution
Testing
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Gingl, Z., Pennetta, C., Kiss, L. B., & Reggiani, L. (1997). Biased percolation and noise analysis of electrical breakdown. In C. Claeys, & E. Simoen (Eds.), Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations (pp. 409-414). World Sci Publ Co Pte Ltd.

Biased percolation and noise analysis of electrical breakdown. / Gingl, Z.; Pennetta, C.; Kiss, L. B.; Reggiani, L.

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. ed. / C. Claeys; E. Simoen. World Sci Publ Co Pte Ltd, 1997. p. 409-414.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gingl, Z, Pennetta, C, Kiss, LB & Reggiani, L 1997, Biased percolation and noise analysis of electrical breakdown. in C Claeys & E Simoen (eds), Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. World Sci Publ Co Pte Ltd, pp. 409-414, Proceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations, Leuven, Belgium, 7/14/97.
Gingl Z, Pennetta C, Kiss LB, Reggiani L. Biased percolation and noise analysis of electrical breakdown. In Claeys C, Simoen E, editors, Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. World Sci Publ Co Pte Ltd. 1997. p. 409-414
Gingl, Z. ; Pennetta, C. ; Kiss, L. B. ; Reggiani, L. / Biased percolation and noise analysis of electrical breakdown. Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. editor / C. Claeys ; E. Simoen. World Sci Publ Co Pte Ltd, 1997. pp. 409-414
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