The X-ray diffraction line-profiles of tensile-deformed copper single crystals were investigated. The broadened line-profiles were markedly asymmetric and were interpreted in terms of long-range internal stresses which prevail in the dislocation cell-structures. Local dislocation densities in and between the cell walls were determined from the sub-profiles obtained by an unambiguous decomposition of the measured asymmetric line-profiles.
|Title of host publication||Proceedings of the Riso International Symposium on Metallurgy and Materials Science|
|Editors||N.Hessel Andersen, M. Eldrup, N. Hansen, D.Juul Jensen, T. Leffers, H. Lilholt, O.B. Pedersen, B.N. Singh|
|Publisher||Riso Natl Lab|
|Number of pages||6|
|Publication status||Published - Dec 1 1984|
|Name||Proceedings of the Riso International Symposium on Metallurgy and Materials Science|
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