Assessment of digital holographic image quality parameters

Zoltán Garaguly, L. Kovács, Miklós Kozlovszky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

High resolution digital images can be taken of small objects, with holography and holographic reconstruction, similarly to traditional phase-contrast microscope. In our paper we focus on the possible image reconstruction quality factors of holographic imaging. We have done a systematic parameter assessment of holographic imaging, using a self-built, in-line, lensless, holographic microscope system. Based on our measurements we have defined and generalized the optimal system parameters of an in-line holographic microscope system.

Original languageEnglish
Title of host publicationSAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages257-262
Number of pages6
ISBN (Electronic)9781728102504
DOIs
Publication statusPublished - Jan 1 2019
Event17th IEEE World Symposium on Applied Machine Intelligence and Informatics, SAMI 2019 - Herl'any, Slovakia
Duration: Jan 24 2019Jan 26 2019

Publication series

NameSAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings

Conference

Conference17th IEEE World Symposium on Applied Machine Intelligence and Informatics, SAMI 2019
CountrySlovakia
CityHerl'any
Period1/24/191/26/19

Fingerprint

Microscope
Image Quality
Image quality
Microscopes
Imaging
Imaging techniques
Phase Contrast
Optimal systems
Optimal System
Holography
Quality Factor
Image Reconstruction
Image reconstruction
Digital Image
High Resolution
Object

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Information Systems
  • Control and Optimization
  • Human-Computer Interaction

Cite this

Garaguly, Z., Kovács, L., & Kozlovszky, M. (2019). Assessment of digital holographic image quality parameters. In SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings (pp. 257-262). [8782715] (SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SAMI.2019.8782715

Assessment of digital holographic image quality parameters. / Garaguly, Zoltán; Kovács, L.; Kozlovszky, Miklós.

SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. p. 257-262 8782715 (SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Garaguly, Z, Kovács, L & Kozlovszky, M 2019, Assessment of digital holographic image quality parameters. in SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings., 8782715, SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 257-262, 17th IEEE World Symposium on Applied Machine Intelligence and Informatics, SAMI 2019, Herl'any, Slovakia, 1/24/19. https://doi.org/10.1109/SAMI.2019.8782715
Garaguly Z, Kovács L, Kozlovszky M. Assessment of digital holographic image quality parameters. In SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. p. 257-262. 8782715. (SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings). https://doi.org/10.1109/SAMI.2019.8782715
Garaguly, Zoltán ; Kovács, L. ; Kozlovszky, Miklós. / Assessment of digital holographic image quality parameters. SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 257-262 (SAMI 2019 - IEEE 17th World Symposium on Applied Machine Intelligence and Informatics, Proceedings).
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